| Scanning Electron Microscopy and X-ray Microanalysis | 
 enlarge | Authors: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.c. Sawyer, J.r. Michael
Publisher: Springer
Category: Book
List Price: $84.95
Buy New: $58.00
You Save: $26.95 (32%)
New (23) Used (14) from $55.00
Avg. Customer Rating:  7 reviews
Sales Rank: 184533
Media: Hardcover
Edition: 3rd
Number Of Items: 1
Pages: 689
Shipping Weight (lbs): 3.6
Dimensions (in): 10.1 x 7.2 x 1.3
ISBN: 0306472929
Dewey Decimal Number: 502.825
EAN: 9780306472923
ASIN: 0306472929
Publication Date: February 2003
Availability: Usually ships in 1-2 business days
Condition: New Book. International Shipping Available
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Product Description
Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This third edition has been extensively revised, including new sections on: - Variable-pressure SEM,
- Electron backscatter diffraction (EBSD),
- Recent developments in x-ray detectors,
and expanded coverage of: - Low-voltage SEM,
- X-ray mapping,
- Specimen preparation.
The text has been used in educating over 3,000 students at the Lehigh Microscopy School SEM short course as well as thousands of undergraduate and graduate students at universities worldwide.
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| Customer Reviews: Read 2 more reviews...
The Bible of All Scanning Electron Microscopy Books September 20, 2008
If you are like me and had to use a Scanning Electron Microscope or SEM, you want to start with the basics that everyone goes by. This book is a safe bet that most everyone knows about. Plus, it is written with very little background in the world of electron microscopy. Too many authors to list but it's wonderful that alot of experts got together to present this material in clear, concise manner. Before you grab your solid-state physics book or check Wikipedia, just relax and page through it since this book pretty much makes it easy for you.
Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM? That's the easiest way to explain rather than list all the chapters. If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding). The size of this book is a BIG PLUS. It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference. For this price, you would be lucky to find another good reference book under $100 with such relevant information.
 Excellent outline of SEM and X-Ray microanalysis February 25, 2008
This book is a comprehensible review of principles and methods of SEM and X-ray microanalysis write in a single and elegant language. The authors avoid using mathematical formulas in the description and demonstration which turn it an atractive book to all scientists and even the beginners.
Great Book !! November 1, 2007
This ought to be the dream book of those who do SEM imaging. The first half or say first five/six chapters are solely devoted to fundamentals of SEMs and the rest of the chapters are dealing generation of X-rays and concentrate on EDS. I have not yet finished reading this book. But certainly recommend to other SEM users to possess this book and read it as and when required.
Book October 27, 2007
The book is very good. I can learn a lot about the SEM from this book. The cd has also some interesting pictures, additional information.
The bibel for EM and X-ray Analysis March 14, 2007
This book is a great book for learning the Basics about Electron Microscopy and X-ray Analysis. You get a good overview!
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